FADOS7F1 18V
Has the feature of recorded data with picture
Recommended for medium and large laboratories already consolidated seeking greater efficiency and have more of a technician.
FADOS7F1 the V/I-Tester of ProT Ar-Ge offers 7 functions in a small and handy test system that requires only a laptop computer to operate. Based on the analog signature analysis functioning defective boards can be compared based on the current-voltage characteristics
(analoge signatures) on the circuit node. The comparison can also be done with already stored signatures of a functioning board very comfortable. In addition to the analyzing mode, the test system can be used as a PC 2-channel oscilloscope.
(analoge signatures) on the circuit node. The comparison can also be done with already stored signatures of a functioning board very comfortable. In addition to the analyzing mode, the test system can be used as a PC 2-channel oscilloscope.
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1. Using Oscilloscope:
Advantage: Used actively in order to control frequency values and signals.
Disadvantage: In case of power supply faults, damaged power circuit, or short circuit; supplying power to the card may cause to aggravate the problem and may cause more components to get damaged. It does not measure the value of components.
2. Using Multimeter:
Advantage: Resistance and diode is measured without supplying power to the card.
Disadvantage: Voltage value applied to the card at resistance degree is lower than 0.5 V. It is about 2V at measuring diode. For this reason, it is not possible to determine the faulty components at many points. Measuring only one value at touched point makes to determine the fault difficult. Values of some components can not be measured because of the influence of some other components on the card. For example, if resistor and capacitor are parallel, it can not measure the capacitor value or shows a false value.
3. Using Current-Voltage (VI) Test Device:
Advantage: Applies a signal to the touched point without supplying power to the card, and compose current-voltage graph. It provides great advantage by composing the graph of touched point at –5V + 5V and at higher voltages and activating conduction at diodes; and eases finding faults since it reveals reverse-voltage leakages.
Disadvantage: Some of the VI devices do not have the feature of measuring the values of components. Most of the models do not have oscilloscope feature. When needed, oscilloscope or multi-meter should exist besides VI test device. Since VI test devices with cathode-tube are huge and heavy, they can not be carried easily. It causes problems for especially travelling technical services.
Advantage: Used actively in order to control frequency values and signals.
Disadvantage: In case of power supply faults, damaged power circuit, or short circuit; supplying power to the card may cause to aggravate the problem and may cause more components to get damaged. It does not measure the value of components.
2. Using Multimeter:
Advantage: Resistance and diode is measured without supplying power to the card.
Disadvantage: Voltage value applied to the card at resistance degree is lower than 0.5 V. It is about 2V at measuring diode. For this reason, it is not possible to determine the faulty components at many points. Measuring only one value at touched point makes to determine the fault difficult. Values of some components can not be measured because of the influence of some other components on the card. For example, if resistor and capacitor are parallel, it can not measure the capacitor value or shows a false value.
3. Using Current-Voltage (VI) Test Device:
Advantage: Applies a signal to the touched point without supplying power to the card, and compose current-voltage graph. It provides great advantage by composing the graph of touched point at –5V + 5V and at higher voltages and activating conduction at diodes; and eases finding faults since it reveals reverse-voltage leakages.
Disadvantage: Some of the VI devices do not have the feature of measuring the values of components. Most of the models do not have oscilloscope feature. When needed, oscilloscope or multi-meter should exist besides VI test device. Since VI test devices with cathode-tube are huge and heavy, they can not be carried easily. It causes problems for especially travelling technical services.
4. Ideal Solution: Using FADOS7F1:
Advantages:
1. FADOS7F1 has all the advantageous features of the mentioned devices, and more. It is a double-channel VI Test device, and all graphs are composed at 2.5 mV sensitivity and by taking 720 different measurements of voltage-current. For this reason, it is very sensitive.
2. At VI Test, by the help of memory feature, it is possible to save the features of solid card to memory and then, to compare with the faulty card sensitively.
3. In order to lower the loss of time during test procedure, it sounds different at compatible and incompatible points. By this way, you can major in the card and make the comparison quickly without any need to look at the card and/or screen steadily.
4. Shows 3 different graphs composed at 3 different steps (Selected current-voltage-frequency steps).
5. Component values can be measured as of multi-meter. Additionally, it shows the values of all components at touched point besides equivalent circuit diagram. This is unique feature.
6. It has oscilloscope feature and it can be used as double-channel memory oscilloscope.
7. By using square-wave signal output, signal is applied to circuit; then, it is possible to see the other channel and output signals at oscilloscope screen.
8. It is easy to carry since it is small. It can be carried in a laptop briefcase.
9. Including many more features explained above, it is like a Swiss knife of people dealing with electronics. You can use any one of the features of FADOS7F1, when you need.
Advantages:
1. FADOS7F1 has all the advantageous features of the mentioned devices, and more. It is a double-channel VI Test device, and all graphs are composed at 2.5 mV sensitivity and by taking 720 different measurements of voltage-current. For this reason, it is very sensitive.
2. At VI Test, by the help of memory feature, it is possible to save the features of solid card to memory and then, to compare with the faulty card sensitively.
3. In order to lower the loss of time during test procedure, it sounds different at compatible and incompatible points. By this way, you can major in the card and make the comparison quickly without any need to look at the card and/or screen steadily.
4. Shows 3 different graphs composed at 3 different steps (Selected current-voltage-frequency steps).
5. Component values can be measured as of multi-meter. Additionally, it shows the values of all components at touched point besides equivalent circuit diagram. This is unique feature.
6. It has oscilloscope feature and it can be used as double-channel memory oscilloscope.
7. By using square-wave signal output, signal is applied to circuit; then, it is possible to see the other channel and output signals at oscilloscope screen.
8. It is easy to carry since it is small. It can be carried in a laptop briefcase.
9. Including many more features explained above, it is like a Swiss knife of people dealing with electronics. You can use any one of the features of FADOS7F1, when you need.
Usage of FADOS7F1:
Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc.
Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
Usage: FADOS7F1 is a double-channel VI tester. While using TEST feature, comparison can be applied without giving energy to card; while using OSCILLOSCOPE feature, energy is given to card and signals are controlled.
Usage1: One of the channels is connected to the chassis of the solid card, other channel is connected to the chassis of faulty card. Same points are touched by both channels. Cards are compared by touching probes to the same points of both cards. If both VI graphics are the same, touched points are solid. If not, VI graphs do not collide one another, and this means the faulty point is found.
Usage2: Different points of solid card can be recorded to memory. These recorded data is, then, opened and used in order to determine the faults on faulty card.
Usage3: Without solid card or recorded data, faulty components can be found by looking at the VI Graph. All components have different graphs; having some experience, user will find the faults just by looking at graphs without comparison.
Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc.
Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
Usage: FADOS7F1 is a double-channel VI tester. While using TEST feature, comparison can be applied without giving energy to card; while using OSCILLOSCOPE feature, energy is given to card and signals are controlled.
Usage1: One of the channels is connected to the chassis of the solid card, other channel is connected to the chassis of faulty card. Same points are touched by both channels. Cards are compared by touching probes to the same points of both cards. If both VI graphics are the same, touched points are solid. If not, VI graphs do not collide one another, and this means the faulty point is found.
Usage2: Different points of solid card can be recorded to memory. These recorded data is, then, opened and used in order to determine the faults on faulty card.
Usage3: Without solid card or recorded data, faulty components can be found by looking at the VI Graph. All components have different graphs; having some experience, user will find the faults just by looking at graphs without comparison.
